a techfocus media publication :: February 26, 2008 :: volume I, no. 08

FROM THE EDITOR

This week, Bryon Moyer takes a look at Mentor Graphics new inFact testbench automation tools combined with their new Multi-view components.  These two technologies work together to break down the communication barriers that can impede progress on verification of today’s complex SoC designs.  Bryon’s latest feature has the details.

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Kevin Morris – Editor in Chief
Techfocus Media, Inc.

EVENTS & ANNOUNCEMENTS

Synopsys Eclypse Low Power Solution:
The perfect alignment of technology, IP, methodology, services and industry standards for low power design.

Learn more!


LATEST NEWS

February 26, 2008

Microchip Technology Unites MIPS Technologies' Analog and Processor IP in Latest 32-bit PIC32 MCU Release

Synopsys Introduces Industry's First Concurrent Hierarchical Design System With Latest IC Compiler Release

IAR Systems announces major upgrade to state machine design tool

Cofluent Studio Adds Advances Modeling Capabilities For Telecommunications and Networking Systems

MunEDA and Technical Systems Integrators (TSI) close Distribution Agreement for USA South East States and Texas

Synfora Delivers Advanced Algorithmic Synthesis for Xilinx 65nm Virtex and Low-Cost Spartan Devices

Elliptic Upgrades to Chip Estimate's Prime IP Partner Program

February 25, 2008

Synopsys Introduces the Eclypse Low Power Solution

Carbon Design Systems to Exhibit at TI Developer Conference 2008 February 26-27

IR’s Real-time Power Monitoring IC Accurately Captures Highly Dynamic Power Information and Maximizes System Performance

Aldec Releases Riviera-PRO™ 2008.02 with VHDL 2007, SystemC 2.2 and SystemVerilog (DPI)

February 22, 2008

Diodes, Inc. Expands Linear Power Product Line with a 1.5A Very Low Dropout Linear Regulator for Processor and ASIC based Applications

February 21, 2008

Synopsys Experts on the Road IP Seminar and Keynote Luncheon With Jeff Ravencraft, President of the USB-IF

Accellera Supports VHDL 4.0 Standard and IEEE 1076TM-2008 Ratification

Mentor Graphics to Present at D.A. Davidson Electronic Systems Design Conference

New Online Demo Shows Interoperable PCell Library Support by Five EDA Vendors

February 20, 2008

Accent Uses Cadence Low-Power Solution for Fast, Accurate Tapeout of Low-Power Production Design

Clock Domain Crossing and Bug Hunting Software Take Center Stage at Real Intent's DVCon Exhibit

Carbon Becomes Fujitsu CedarTM-ESL Services Partner

Silicon Valley Semiconductor Engineers Conduct DUT-Level Qualification Burn-In Off-Site Under New Partnership Between Antares Advanced Test Technologies and IC Test Lab

EMA Announces TimingDesigner Design Kit Program With First Vendor Kits Developed by GSI Technology, Inc.

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CURRENT FEATURE ARTICLES

The Very Model Of Reusability
(Bryon Moyer)
Attacking Abuses of Power – Part 1
(Bryon Moyer)
The Green Monster Stirs
(Bryon Moyer)
DesignCon Steps it Up
Eye Candy for the Digital Designer (Kevin Morris)
A Bid to Simplify Flash Subsystem Design
(Bryon Moyer)
45nm From 30,000 ft
(Bryon Moyer)
Burning the Secret Sauce
When Paranoia Impedes Progress (Kevin Morris)

JOURNAL WEBCASTS

CHALK TALK Accelerate SoC and ASIC Verification Using FPGA Prototypes - Join Amelia Dalton as she explores methods of ASIC verification available today and why FPGA-based prototypes offer the most affordable and most powerful solution. (Synplicity)

CHALK TALK Advancing SoC Verification Methods – Join Amelia Dalton as she talks with experts from Mentor Graphics on processor-driven test and other techniques for solving your system-on-chip verification problems. (Mentor Graphics)

CHALK TALK Real World Solutions for FPGAs in Ultra Low Power Applications - Join Amelia Dalton as she examines the Low Power Reference Platform from Arrow, Altera, and Linear Technology - proving that FPGAs really can run on batteries. (Altera, Arrow, Linear)

CHALK TALK Did you miss the ARM Developers' Conference?  Join Amelia Dalton for Journal Webcasts' coverage of the event - it'll be just like you were there! (Journal Webcasts)


The Very Model Of Reusability
(Bryon Moyer)

Silos can be wonderful things when used properly. They keep your grain dry when it rains. They provide a handy storage. They can look lovely, providing the only real topography in an otherwise 2-D landscape. And they evoke the heart of America (well, to Americans anyway… no intent to disenfranchise the rest of the world).

Unfortunately, silos aren’t restricted to the picturesque plains of the Midwest. They exist amongst us, around us. Many of us work in silos. We are indeed kept out of the rain, and sometimes it feels like we’re in storage; we might even be picturesque. But we’re also kept from being as productive as we could be.

The progression of a system design from architect to implementation to system test tends to involve the bare minimum of interaction between silos. The architect works in one silo, ships out a specification to a designer that will implement the design, who ships the design and some specs out to a test engineer tasked with ensuring that systems shipped work correctly. Electronic System Level (ESL) design techniques are intended to break these silos and allow more of the work done up front to be incorporated into the final product, with less rework each step of the way. But ESL has been slow to catch on, and part of the reason may be that there are some sizeable gaps remaining in the design flow that severely mitigate the benefits of investing in ESL tools.

The typical system design process starts with an architect and/or system designer scoping out the high-level behaviors that the system should exhibit. This is done typically in an abstract fashion using languages like C and C++ or systems like Matlab. The designer will put together some kind of model and testbench to check out the specification, defining specific directed tests to prove that his or her ideas work. The idea is to explore all the basic desired areas of operation of the function. Increasingly, transaction-level modeling (TLM) can be used at a high level to speed up simulation.

Once that’s done, the design gets handed off to the dude that’s going to implement the design, typically using RTL (since we’re talking about digital stuff). This designer will also have to create models and a testbench, this time using RTL. And in addition to the directed tests written to prove that the key functions work properly, additional tests are also created to explore the corners of the design space, those bizarre combinations that no one expects but that could unleash the hidden darker side of the design.

Exhaustive test vectors can be generated using different techniques, but since “random” generation for complex designs can generate too many useless vectors, “constrained random” is more common – but this will still get you millions of vectors. Test coverage analysis then will typically inform the designer that there are various hard-to-reach places that didn’t get explored. The more complicated the design, the harder some areas are to reach. So more vectors are generated either manually or with manual direction to ease coverage up to an acceptable level. [more]


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