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| Source: Tektronix Tektronix Introduces Most Comprehensive Test Set for Next Generation DDR3 MemoryComprehensive Test from Analog to Digital Validation for All DDR Versions; New TLA7BB4 Module Provides the Only Logic Analysis Solution to Address All DDR Speeds BEAVERTON, Ore., 6th May 2008 - Tektronix, Inc., a leading worldwide provider of test, measurement and monitoring instrumentation, announced a comprehensive test toolset for DDR2 and new DDR3 technology www.tek.com/memory. DDR3 is the next generation of Double Data Rate (DDR)Synchronous Dynamic Random Access Memory (SDRAM) that will deliver higher performance data rates. The Tektronix DDR test solution supports all speeds of DDR, DDR2 and DDR3, spans both analog and digital domains, and is based upon industry-leading hardware and software. Tektronix offers the engineering customer a complete DDR3 test bench. The DDR3 standard supports data rates of 800 mega transfers per second (MT/s) to 1600 MT/s with clock frequencies of 400 MHz to 800 MHz respectively, double the speed of DDR2 technology. DDR3 should be ideal for high-performance applications such as file servers, video on demand, encoding and decoding, gaming, and 3-D visualization. For digital validation and debug, the TLA7000 logic analyzer and the new TLA7BB4 acquisition module provide the only logic analysis solution available to address all speeds of DDR, DDR2 and DDR3, including DDR3-1600. Furthermore, this new DDR test set provides a cost savings up to 30% over existing approaches. The TLA7BB4 with Nexus Technology DDR3/DDR2 Protocol Violation Software automates the analysis of a DDR2 or DDR3 bus to quickly and easily identify protocol violations, frequency of those violations, and also provide a global view of all the DDR commands in the logic analyzer memory. With memory support and probing solutions, the TLA7000 series provides the most capable solution for digital validation and debug. Physical link analysis is performed using a DSA8200 sampling oscilloscope for TDR-based signal path characterization and circuit board verification. For analog validation and debug, the new DDR Analysis option (opt. DDRA) on the DSA70000 family of Digital Serial Analyzers along with matching P7500 TriMode™ active differential probes and DPOJET measurement software, provide a powerful debug toolset that automatically identifies reads and writes, and performs Clock, Jitter, Amplitude, Timing, and Eye Diagram measurements. New DDR probe tips for the P7500 Series are able to attach to hard to reach portions of the device under test. Pricing and Availability About Tektronix
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