Sequence CTO Frenkil Details Ultra-Low Leakage Power Strategy at DATE

Design Automation and Test in Europe 2008

--(BUSINESS WIRE)--Sequence Design:

WHO: Jerry Frenkil, Sequence Design CTO; Ken Choi, Illinois Institute of Technology; and Kimiyoshi Usami, Shibaura Institute of Technology

WHAT: DATE Tutorial: “Power Gating for Ultra-Low Leakage: Physics, Design, and Analysis.” For more information: www.date-conference.com.

WHEN: Monday, March 10, 09:30am

WHERE: Room E-1, ICM, DATE 2008 Conference, Munich, Germany.

WHY: The demand for portable electronic devices continues to grow rapidly and has generated great interest in low-power design, which initially focused on controlling dynamic power consumption. However, the combination of wireless device operational characteristics and exponentially increasing leakage power in new processes motivated the development of leakage reduction techniques. Power gating has emerged as the most effective design technique for achieving ultra-low leakage power. This tutorial will provide detailed descriptions of the physics, motivations, benefits, challenges, techniques, methods, and tradeoffs associated with the design of power gated circuits.

BACKGROUND: Sequence Design accelerates the ability of SoC designers to bring high-performance, power-aware ICs quickly to market. Sequence Design-For-Power solutions give customers the competitive advantage necessary to excel in aggressive technology markets. For more information: www.sequencedesign.com.

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